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Journal of Applied Physics

Volumn 106, Issue 3, 2009, Pages

Multiple scattering x-ray photoelectron diffraction study of the SrTiO 3 (100) surface

(4) Pancotti, A a Barrett, N b Zagonel, L F b Vanacore, G M c

a UNIVERSITY OF CAMPINAS (Brazil)

b CEA SACLAY (France)

c POLITECNICO DI MILANO (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC POTENTIAL; ATOMIC SURFACES; CORE LEVELS; DIFFRACTION PEAKS; EXPERIMENTAL DATA; FORWARD SCATTERING; IN-VACUUM; LOW-ENERGY ELECTRON DIFFRACTION; MULTIPLE SCATTERING CALCULATIONS; PHOTOELECTRON DIFFRACTION; SRTIO; SURFACE RUMPLING; TIO; X-RAY PHOTOELECTRON DIFFRACTION;

ATOMS; CRYSTAL ATOMIC STRUCTURE; ELECTRON DIFFRACTION; FLOWCHARTING; MULTIPLE SCATTERING; PHOTOELECTRONS; PHOTOIONIZATION; PHOTONS; SINGLE CRYSTALS; STRONTIUM ALLOYS; SURFACE STRUCTURE;

SURFACE RELAXATION;

EID: 69149097398 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3183938 Document Type: Article

Times cited : (23)

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