Interface characterization of cobalt contacts on bismuth selenium telluride for thermoelectric devices

Electrochemical and Solid-State Letters

Volumn 12, Issue 10, 2009, Pages

  Gupta, R P ^a   Iyore, O D ^a   Xiong, K ^a   White, J B ^b   Cho, Kyeongjae ^a   Alshareef, H N ^a,c   Gnade, B E ^a  

^a The University of Texas at Dallas   (United States)

^b Marlow Industries Inc   (United States)

^c KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Saudi Arabia)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEAL TEMPERATURES; COEFFICIENT OF THERMAL EXPANSION; EXPERIMENTAL OBSERVATION; FIRST-PRINCIPLES CALCULATION; INTERFACE CHARACTERIZATION; LESS-DIFFUSION; NI DIFFUSION; THERMOELECTRIC DEVICES;

BISMUTH; COBALT; PHASE INTERFACES; SELENIUM; TELLURIUM COMPOUNDS;

THERMAL EXPANSION;

EID: 68949151602     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.3196237     Document Type: Article

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