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Volumn 80, Issue 7, 2009, Pages

Measurements of thermal effusivity of a fine wire and contact resistance of a junction using a T type probe

Author keywords

[No Author keywords available]

Indexed keywords

HOT WIRES; LABVIEW; LOCK-IN; MEASUREMENT SYSTEM; METALLIC WIRE; PERIODIC HEATING; PLATINUM WIRE; ROOM TEMPERATURE; TEMPERATURE RESPONSE; TEST WIRES; THERMAL CONTACT RESISTANCE; THERMAL EFFUSIVITY;

EID: 68949122605     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3159863     Document Type: Article
Times cited : (32)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.