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Volumn 103, Issue 6, 2009, Pages

Dependence of band-renormalization effects on the number of copper oxide layers in tl-based copper oxide superconductors revealed by angle-resolved photoemission spectroscopy

(9) Lee, W S a Tanaka, K b Vishik, I M c Lu, D H d Moore, R G d Eisaki, H e Iyo, A e Devereaux, T P a Shen, Z X a,c,d

a SLAC NATIONAL ACCELERATOR LABORATORY (United States)

b LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

c STANFORD UNIVERSITY (United States)

d SLAC NATIONAL ACCELERATOR LABORATORY (United States)

e NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE RESOLVED PHOTOEMISSION SPECTROSCOPY; ANGLE-RESOLVED PHOTOEMISSION; BAND DISPERSIONS; BI-BASED CUPRATES; COMPARISON STUDY; COPPER OXIDE LAYERS; LAYER NUMBER; RENORMALIZATION EFFECTS; RESONANCE MODE; SINGLE LAYER; SUPERCONDUCTING CUPRATES; TL-1223;

BISMUTH COMPOUNDS; COPPER COMPOUNDS; COPPER OXIDES; EMISSION SPECTROSCOPY; MULTILAYERS; OXIDE SUPERCONDUCTORS; PHOTOEMISSION; SUPERCONDUCTIVITY;

THALLIUM COMPOUNDS;

EID: 68649127916 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.103.067003 Document Type: Article

Times cited : (19)

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