Microstructure and transport properties of Y-rich YBa 2Cu 3O 7-δ thin films

Journal of Applied Physics

Volumn 100, Issue 5, 2006, Pages

  Wang, H ^a   Serquis, A ^b   Maiorov, B ^c   Civale, L ^c   Jia, Q X ^c   Arendt, P N ^c   Foltyn, S R ^c   MacManus Driscoll, J L ^d   Zhang, X ^e  

^a TEXAS A AND M UNIVERSITY   (United States)

^b Facultad de Ciencias Naturales e Instituto M Lillo   (Argentina)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

^d UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^e Texas AandM University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR-DEPENDENCE MEASUREMENTS; FIELD-DEPENDENCE MEASUREMENTS; METAL SUBSTRATES;

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); MICROSTRUCTURE; POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS;

THIN FILMS;

EID: 33748885283     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2337262     Document Type: Article

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