X-ray investigation of CdSe nanowires

Physica Status Solidi (A) Applications and Materials Science

Volumn 206, Issue 8, 2009, Pages 1752-1756

  Kurtulus, Ozgul ^a   Li, Zhen ^b   Mews, Alf ^c   Pietsch, Ullrich ^d  

^a DOGUS UNIVERSITY   (Turkey)

^b UNIVERSITY OF QUEENSLAND   (Australia)

^c UNIVERSITY OF HAMBURG   (Germany)

^d UNIVERSITY OF SIEGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENCE LENGTHS; DOMAIN SIZE; GROWTH DIRECTIONS; NANOCATALYSTS; PEAK BROADENING; REFLECTION INTENSITY; RELATIVE CONTRIBUTION; SCATTERING LENGTH; STRUCTURAL CHARACTERIZATION; STRUCTURE UNIT; TEM; WURTZITE STRUCTURE; WURTZITES; X-RAY INVESTIGATIONS; X-RAY POWDER DIFFRACTION; ZINC-BLENDE;

CADMIUM ALLOYS; CADMIUM COMPOUNDS; ELECTRIC WIRE; NANOWIRES; SINGLE CRYSTALS; STACKING FAULTS; ZINC;

ZINC SULFIDE;

EID: 68649112347     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200881614     Document Type: Conference Paper

References (33)

1. W. J. Parak, D. Gerion, and T. Pellegrino, Nanotechnology 14, 59672 (2003).
2. S.Kumar,M. Ade, and T. Nann, Chem. Eur. J. 11, 2220 (2005).
3. Z. A. Peng and X. Peng, J. Am. Chem. Soc. 123, 1389 (2001).
4. Y. Yin and A. P. Alivisatos, Nature 437, 664 (2005).
5. Z. Yu,M. A. Hahn, and S. E. Maccagnano-Zacher, ACS Nano. 2, 1179 (2008).
6. S. Kar, S. Santra, and H. Heinrich, J. Phys. Chem. C Lett. 112, 4036 (2008).
7. L. Manna, E. C. Scher, and L. S. Li, J. Am. Chem. Soc. 124, 7136 (2002).
8. A. S. Masadeh, E. S. Bozin, and C. L. Farrow, Phys. Rev. B 76, 115413 (2007).
9. F. Niederdraenk, K. Seufert, and P. Luczak, Phys. Status Solidi C 4, 3234 (2007).
10. C. Kumpf, R. B. Neder, and F. Niederdraenk, J. Chem. Phys. 123, 224707 (2005).
11. S. Kumar and T. Nann, Small 2, 316 (2006).
12. Z. Li, O. Kurtulus, F. Nan, A. Myalitsin, Z. Wang, A. Kornowski, U. Pietsch, A. Mews, submitted to JACS (2009).
13. R. B. Neder, V. I. Korsunskiy, and Ch. Chory, Phys. Status Solidi C 4, 3221 (2007).
14. C. L. Farrow, P. Juhas, and J.W. Liu, J. Phys.: Condens. Matter 19, 335219 (2007).
15. P. Scardi, M. Leoni, and R. Delhez, J. Appl. Cryst. 37, 381 (2004).
16. Z. Li, A. Kornowski, A. Myalitsin, and A. Mews, Small 4, 1698 (2008).
17. A. P. Hammersley, S. O. Svensson, M. Hanfland, A. N. Fitch, and D. Ḧausermann, High Pressure Res. 14, 235 (1996).
18. D. P. Padiyan and A. Marikani, Cryst. Res. Technol. 37, 1241 (2002).
19. U. Pal, D. Samanta, and S. Ghorai, J. Phys. D, Appl. Phys. 25, 1488 (1992).
20. C. B. Murray, D. J. Norris, and M. G. Bawendi, J. Am. Chem. Soc. 115, 8706 (1993).
21. X. Peng, L. Manna, and W. Yang, Nature 404, 59 (2000).
22. M. G. Bawendi, A. R. Kortan, and M. L. Steigerwald, J. Chem. Phys. 91, 7282 (1989).
23. P. J. Wu, Y. P. Stetsko, and K. D. Tsuei, Appl. Phys. Lett. 90, 161911 (2007).
24. L. Manna, E. C. Scher, and A. P. Alivisatos, J. Am. Chem. Soc. 122, 12700 (2000).
25. International Tables for Crystallography Vol. C, edited by A. J. C. Wilson (Kluwer Academic Publishers, Dordrecht, 1995).
26. N. S. Lam, K.W.Wong, and Q. Li, Nanotechnology 18, 415607 (2007).
27. O. Madelung, U. Russler, and M. Schulz, II-VI and I-VII Compounds; Semimagnetic Compounds (Springer-Verlag, Berlin, 1999).
28. K. Balamurugan, R. Saravanan, and K. Asharamani, J. Cryst. Growth 250, 382 (2003).
29. C. Y. Yeh, Z. W. Lu, and S. Froyen, Phys. Rev. B 46, 10086 (1992).
30. B. E. Warren, X-Ray Diffraction (Dover Publications, Inc., New York, 1990), chap. 13.6.
31. J. H. Grebinski, K. L. Hull, J. Zhang, T. H.Kosel, and M.Kuno, Chem. Mater. 16, 5260 (2004).
32. G. K. Williamson and W. H. Hall, Acta Metall. 1, 22 (1953).
33. M. T. Sebastian and P. Krishna, Random, Non-Random and Periodic Stacking Faults in Crystals (Gordon&Breach Science Publisher Ltd., Langhorne, 2004).