A synchrotron tensile test setup for nanocrystalline thin films

Physica Status Solidi (A) Applications and Materials Science

Volumn 206, Issue 8, 2009, Pages 1795-1798

  Ulyanenkova, T ^a   Baumbusch, R ^a   Filatova, T ^a   Doyle, S ^b   Castrup, A ^b   Gruber, P A ^a   Markmann, J ^c   Weissmuller J ^b   Baumbach, T ^a,b   Hahn, H ^b   Kraft, O ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c SAARLAND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION SIGNALS; FORSCHUNGSZENTRUM KARLSRUHE; IN-SITU; NANOCRYSTALLINE PALLADIUM; NANOCRYSTALLINE THIN FILMS; TENSILE DEFORMATION; TENSILE TESTS;

DIFFRACTION; PALLADIUM; TENSILE TESTING; THIN FILMS;

NANOCRYSTALLINE MATERIALS;

EID: 68649102993     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200881599     Document Type: Conference Paper

References (4)

1. G. K. Williamson and W. H. Hall, Acta Metall. 1, 22 (1953).
2. J. Markmann, V. Yamakov, and J. Weissmüller, Scr. Mater. 59(1), 15, (2008).
3. J. Markmann, Dissertation, Universität des Saarlandes (2005).
4. H.Van Swygenhoven, B. Schmitt, P. M. Derlet, S.Van Petegem, A. Cervellino, Z. Budrovic, S. Brandstetter, A. Bollhalder, and M. Schild, Rev. Sci. Instrum. 77, 013902 (2006).