Discrete diffraction for analytical approach to tightly focused electric fields with radial polarization

Optics Communications

Volumn 282, Issue 19, 2009, Pages 3862-3868

  Marrocco, Michele ^a  

^a ENEA   (Italy)

Author keywords

Diffraction; Intensity distribution; Microscopy; Numerical aperture; Polarization

Indexed keywords

ANALYTICAL APPROACH; ANALYTICAL EXPRESSIONS; DIFFRACTION LIMITS; DISCRETE DIFFRACTION; DISCRETIZATIONS; FOCAL VOLUME; HIGH-RESOLUTION MICROSCOPY; INTENSITY DISTRIBUTION; MICROSCOPY; NEW APPROACHES; NUMERICAL APERTURE; NUMERICAL CALCULATION; RADIAL POLARIZATION; RADIALLY POLARIZED LASER BEAM; RELATIVE DEVIATIONS;

DIFFRACTION; ELECTRIC FIELDS; LASER BEAMS; NUMERICAL METHODS; POLARIZATION;

LIGHT;

EID: 68549132411     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2009.06.055     Document Type: Article

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