Probing more than the surface

Materials Today

Volumn 12, Issue 7-8, 2009, Pages 46-50

  Dickinson, Michelle E ^a   Schirer, Jeffrey P ^b  

^a UNIVERSITY OF AUCKLAND   (New Zealand)

^b Bruker Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

3D IMAGING; IN-SITU SCANNING PROBE MICROSCOPY; NANO-MATERIALS; NANOINDENTER TIP; NOVEL MATERIALS; SMALL SCALE; THIN FILM MATERIAL;

MECHANICAL PROPERTIES; NANOINDENTATION; THREE DIMENSIONAL;

ATOMIC FORCE MICROSCOPY;

EID: 68349143120     PISSN: 13697021     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-7021(09)70202-0     Document Type: Review

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