메뉴 건너뛰기




Volumn 32, Issue 2, 2009, Pages 478-483

A fast algorithm for thermal transient multisource simulation using interpolated zth functions

Author keywords

Multichip packages; Multiple heat sources; Thermal transient simulation

Indexed keywords

COMPUTATIONAL COSTS; CONVOLUTION INTEGRALS; CUBIC-SPLINE INTERPOLATION; ELECTRONIC DEVICE; ENERGY-CONSERVING; FAST ALGORITHMS; FINITE ELEMENT SIMULATIONS; MODEL REDUCTION; MULTICHIP-PACKAGES; MULTIPLE HEAT SOURCES; MULTISOURCES; POWER DISSIPATION; POWER PROFILE; SPREADSHEET PROGRAM; STRAIGHT-FORWARD METHOD; TEMPERATURE PROFILES; THERMAL TRANSIENT SIMULATION; THERMAL TRANSIENTS; TRANSIENT THERMAL RESPONSE;

EID: 68349133297     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2008.2001172     Document Type: Article
Times cited : (18)

References (5)
  • 1
    • 15744401565 scopus 로고    scopus 로고
    • A new procedure for the calculation of the temperature development in electronic systems
    • Lausanne, Switzerland, CD-ROM
    • Y. C. Gerstenmair and G. Wachutka, "A new procedure for the calculation of the temperature development in electronic systems," in Proc. EPE'99 Conf., Lausanne, Switzerland, 1999, CD-ROM.
    • (1999) Proc. EPE'99 Conf
    • Gerstenmair, Y.C.1    Wachutka, G.2
  • 2
    • 68349130817 scopus 로고    scopus 로고
    • Calculation of the temperature development in electronic systems by convolution integrals
    • San Jose, CA
    • Y. C. Gerstenmair and G. Wachutka, "Calculation of the temperature development in electronic systems by convolution integrals," in Proc. 16th SEMITHERM, San Jose, CA, 2000, pp. 50-59.
    • (2000) Proc. 16th SEMITHERM , pp. 50-59
    • Gerstenmair, Y.C.1    Wachutka, G.2
  • 3
    • 0032028593 scopus 로고    scopus 로고
    • Identification of RC networks by deconvolution: Chances and limits
    • Mar
    • V. Szekely, "Identification of RC networks by deconvolution: Chances and limits," IEEE Trans. Circuits Syst., vol. 45, no. 3, pp. 244-258, Mar. 1998.
    • (1998) IEEE Trans. Circuits Syst , vol.45 , Issue.3 , pp. 244-258
    • Szekely, V.1
  • 4
    • 0033741467 scopus 로고    scopus 로고
    • Thermal RC-network approach to analyze multichip power packages
    • San Jose, CA
    • T. Hauck and T. Bohm, "Thermal RC-network approach to analyze multichip power packages," in Proc. 16th SEMITHERM, San Jose, CA, 2000, pp. 227-234.
    • (2000) Proc. 16th SEMITHERM , pp. 227-234
    • Hauck, T.1    Bohm, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.