Optical and structural properties of ZnSxSe1-3 thin films deposited by thermal evaporation

EPJ Applied Physics

Volumn 48, Issue 1, 2009, Pages

  Ashraf, M ^a   Akhtar, S M J ^a   Mehmood, M ^b   Qayyum, A ^c  

^a Optics Laboratories   (Pakistan)

^b PAKISTAN INSTITUTE OF ENGINEERING AND APPLIED SCIENCES   (Pakistan)

^c PAKISTAN INSTITUTE OF NUCLEAR SCIENCE AND TECHNOLOGY   (Pakistan)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL ENERGY BAND GAP; POLYCRYSTALLINE; PREFERRED ORIENTATIONS; SODA LIME GLASS SUBSTRATE; SULFUR CONTENTS; THERMAL EVAPORATION TECHNIQUE; XRD MEASUREMENTS;

ENERGY GAP; LATTICE CONSTANTS; LIGHT REFRACTION; LIGHT TRANSMISSION; REFRACTIVE INDEX; REFRACTOMETERS; SEMICONDUCTING SELENIUM COMPOUNDS; SULFUR; VAPORS; ZINC SULFIDE;

THERMAL EVAPORATION;

EID: 68349107804     PISSN: 12860042     EISSN: 12860050     Source Type: Journal    
DOI: 10.1051/epjap/2009114     Document Type: Article

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