Scanning electron microscopy and energy dispersive X-ray microanalysis of Perna canaliculus mussel larvae adhesive secretion

Journal of Adhesion

Volumn 85, Issue 2-3, 2009, Pages 78-96

  Petrone, Luigi ^a   Ragg, Norman L C ^b   Girvan, Liz ^a   McQuillan, A James ^a  

^a UNIVERSITY OF OTAGO   (New Zealand)

^b CAWTHRON INSTITUTE   (New Zealand)

Author keywords

Adhesive secretion; EDX microanalysis; Electron microscopy; Mussel larvae; Perna canaliculus; Primary settlement

Indexed keywords

CRYO-SCANNING ELECTRON MICROSCOPY; EDX MICROANALYSIS; ELEMENTAL COMPOSITIONS; ENERGY DISPERSIVE X RAY MICROANALYSIS; ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; HUMIDITY CONDITIONS; HYGROSCOPIC NATURE; MUSSEL LARVAE; PERNA CANALICULUS; POLYANIONICS; PRIMARY SETTLEMENT; SWELLING BEHAVIOUR; TEFLON SUBSTRATE;

BIOLOGICAL MATERIALS; CALCIUM; CALCIUM ALLOYS; ELECTRONS; FIELD EMISSION; FIELD EMISSION MICROSCOPES; GELATION; GLASS; HYDRATES; MEASUREMENT THEORY; MICROANALYSIS; PHOSPHORUS; SCANNING; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SULFUR;

ELECTRON MICROSCOPES;

EID: 68349104851     PISSN: 00218464     EISSN: 15455823     Source Type: Journal    
DOI: 10.1080/00218460902782055     Document Type: Article

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