Sputtering of ordered ice Ih adsorbed on Rh(111) using hyperthermal neutral Ar atoms

Journal of Physical Chemistry C

Volumn 113, Issue 30, 2009, Pages 13325-13330

  Gibson, K D ^a   Killelea, D R ^a   Sibener, S J ^a  

^a UNIVERSITY OF CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AR ATOM; AZIMUTHAL ANGLE; COMPOSITIONAL DEPTH PROFILING; CRYSTALLINE STRUCTURE; ION SPUTTERING; ION-INDUCED SPUTTERING; NEUTRAL MOLECULES; OVERLAYERS; PHYSISORBED; SECONDARY ION MASS SPECTROSCOPY; SPUTTERING YIELDS; THREE-LAYER; WATER MOLECULE;

ATOMS; DEPTH PROFILING; DESORPTION; IONS; RHODIUM; SECONDARY ION MASS SPECTROMETRY; SPUTTERING; TRACE ANALYSIS;

MOLECULES;

EID: 68349104234     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp901874d     Document Type: Article

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