Characterization of oxide films formed on alloy 182 in simulated PWR primary water

Journal of Nuclear Materials

Volumn 393, Issue 2, 2009, Pages 242-248

  Liu, J H ^a   Mendonca R ^b,c   Bosch, R W ^a   Konstantinovic M J ^a  

^a BELGIAN NUCLEAR RESEARCH CENTRE   (Belgium)

^b CDTN   (Brazil)

^c REDEMAT   (Brazil)

Author keywords

Alloy 182; Oxide film; Raman spectroscopy; SEM; XPS

Indexed keywords

CHROMIUM OXIDES; DOUBLE LAYER STRUCTURE; EXPOSURE TIME; INNER LAYER; OUTER LAYER; PRIMARY WATER; REDOX POTENTIALS; SEM; XPS;

ALLOYS; CHROMIUM; NICKEL OXIDE; PRESSURIZED WATER REACTORS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SMALL NUCLEAR REACTORS; X RAY PHOTOELECTRON SPECTROSCOPY;

OXIDE FILMS;

EID: 68349095137     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2009.06.012     Document Type: Article

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