XPS depth profiling of oxide scales of stainless steels formed in high-temperature aqueous conditions

Surface and Interface Analysis

Volumn 38, Issue 4, 2006, Pages 396-400

  Ignatova, V A ^a   Dyck, St Van ^a   Grotzschel R ^b   Moller W ^b  

^a BELGIAN NUCLEAR RESEARCH CENTRE   (Belgium)

^b INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

Quantification; Stainless steels corrosion; XPS

Indexed keywords

COMPUTER SIMULATION; HIGH TEMPERATURE EFFECTS; MAGNETRON SPUTTERING; RUTHERFORD BACKSCATTERING SPECTROSCOPY; STEEL CORROSION; X RAY PHOTOELECTRON SPECTROSCOPY;

ION SPUTTERING; QUANTIFICATION; STAINLESS STEELS CORROSION; SUBSTRATE INTERFACES;

STAINLESS STEEL;

EID: 33646589707     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2140     Document Type: Conference Paper

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