Erratum: Generalized procedure to determine the dependence of steady-state photoconductance lifetime on the occupation of multiple defects (Journal of Applied Physics (2008) 104 (084503))

Journal of Applied Physics

Volumn 106, Issue 2, 2009, Pages

  McIntosh, Keith R ^a   Paudyal, Bijaya B ^a   MacDonald, Daniel H ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 68249156739     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3194320     Document Type: Erratum

References (4)

1. S. Reggiani, M. Valdinoci, L. Colalongo, M. Rudan, G. Baccarani, A D. Stricker, F. Illien, N. Felber, W. Fichtner, and L. Zullino, IEEE Trans. Electron Devices 49, 490 (2002). 10.1109/16.987121 (Pubitemid 34404848)
2. B. B. Paudyal, K. R. McIntosh, D. H. Macdonald, B. S. Richards, and R. A. Sinton, Prog. Photovoltaics 16, 609 (2008). 10.1002/pip.839
3. J. S. Blakemore, Semiconductor Statistics, Sec. 8.4 (Pergamon, Oxford, 1962).
4. J. A. Hornbeck and J. R. Haynes, Phys. Rev. 97, 311 (1955). 10.1103/PhysRev.97.311