Tip-enhanced Raman spectroscopy of graphite irradiated by focused ion beam

Optics Letters

Volumn 34, Issue 15, 2009, Pages 2246-2248

  Chan, Tsu Shin ^a,b   Dvoynenko, Mykhaylo M ^a,c   Liu, Chih Yi ^a,d   Wang, Juen Kai ^a,b   Wang, Yuh Lin ^a,b  

^a INSTITUTE OF ATOMIC AND MOLECULAR SCIENCES   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

^d NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC FIELDS; GRAPHITE; RAMAN SPECTROSCOPY;

ANISOTROPIC MATERIAL; ENHANCEMENT FACTOR; EXPOSED TO; FOCUSED GA; G-MODES; MEASURED SIGNALS; SPATIAL RESOLUTION; TIP-ENHANCED RAMAN SPECTROSCOPY;

ION BEAMS;

EID: 68149178364     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.34.002246     Document Type: Article

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