The CVD of silver selenide films from dichalcogenophosphinato and imidodichalcogenodiphosphinatosilver(I) single-source precursors

Journal of Materials Chemistry

Volumn 19, Issue 3, 2009, Pages 419-427

  Panneerselvam, Arunkumar ^a   Nguyen, Chinh Q ^a   Malik, Mohammad A ^a   O’Brien, Paul ^a   Raftery, James ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ENERGY DISPERSIVE X RAY ANALYSIS; SCANNING ELECTRON MICROSCOPY; SELENIUM COMPOUNDS; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION;

AEROSOL-ASSISTED CHEMICAL VAPOUR DEPOSITIONS; ENERGY DISPERSIVE X-RAY ANALYSIS (EDX); LOW PRESSURES; SILVER SELENIDES; SINGLE-SOURCE PRECURSOR; SYNTHESISED; TETRAHEDRAL ARRANGEMENT;

SILVER COMPOUNDS;

EID: 68049133316     PISSN: 09599428     EISSN: 13645501     Source Type: Journal    
DOI: 10.1039/b812074a     Document Type: Article

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