Thermal stability of silver selenide thin films on silicon formed from the solid state reaction of Ag and Se films

Thin Solid Films

Volumn 515, Issue 4, 2006, Pages 2059-2065

  Mohanty, Bhaskar Chandra ^a   Kasiviswanathan, S ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

Author keywords

Agglomeration; Annealing; Rutherford backscattering spectrometry; Scanning electron microscopy; Silver selenide

Indexed keywords

RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICON; SILVER COMPOUNDS; THERMODYNAMIC STABILITY; X RAY DIFFRACTION ANALYSIS;

AGGLOMERATED MORPHOLOGY; SILICON SUBSTRATES; SILVER SELENIDE; SOLID STATE REACTION;

THIN FILMS;

EID: 33750842326     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.05.020     Document Type: Article

References (34)

1. Kaito C., Nakamura N., Teranishi K., Sekimoto S., and Shijori M. Phys. Status Solidi, A 71 (1982) 109
2. De Ridder R., and Amelinckx S. Phys. Status Solidi, A 18 (1973) 99
3. Vucic Z., and Gladic J. J. Cryst. Growth 205 (1999) 136
4. Kumashiro Y., Ohachi T., and Taniguchi I. Solid State Ionics 86-88 (1996) 761
5. Fang C.M., de Groot R.A., and Wiegers G.A. J. Phys. Chem. Solids 63 (2002) 457
6. JCPDS Powder Diffraction Database, PDF-2, International Centre for Diffraction Data, 24-1041 (1997).
7. Abdullayev A.G., Shafizade R.B., Krupnikov E.S., and Kiriluk K.V. Thin Solid Films 106 (1983) 175
8. Okabe T., and Ura K. J. Appl. Crystallogr. 27 (1994) 140
9. Constantinescu L.V. Thin Solid Films 32 (1976) 333
10. Xu R., Husmann A., Rosenbaum T.F., Saboungi M.L., Enderby J.E., and Littlewood P.B. Nature 390 (1997) 57
11. Beck G., Korte C., Janek J., Gruhl F., and Kreutzbruck M. J. Appl. Phys. 96 (2004) 5619
12. Von Kreutzbruck M., Mogwitz B., Gruhl F., Kienle L., Korte C., and Janek J. Appl. Phys. Lett. 86 (2005) 072102
13. Husmann A., Betts J.B., Boebinger G.S., Migliori A., Rosenbaum T.F., and Saboungi M.L. Nature 417 (2002) 421
14. Peng Y.C., Chen C.R., and Chen L.J. J. Mater. Res. 13 (1998) 90
15. Safran G., Keusch P., Gunter J.R., and Barna P.B. Thin Solid Films 215 (1992) 147
16. Günter J.R., and Keusch P. Ultramicroscopy 49 (1993) 293
17. Somogyi K., and Safran G. J. Appl. Phys. 78 (1995) 6855
18. Du X., and Hebard A.F. Appl. Phys. Lett. 82 (2003) 2293
19. Safran G., Geszti O., and Radnoczi G. Thin Solid Films 440 (2003) 261
20. Doolittle L.R. Nucl. Instrum. Methods, B 9 (1985) 344
21. M. Thompson, L. Doolittle, RUMP-RBS Analysis and Simulation Package© 1988-1997, Computer Graphic Service, Ltd.; www.genplot.com/doc.
22. Chu W., Mayer J.W., and Nicolet M.A. Backscattering Spectrometry (1978), Academic Press, Inc., Orlando, Florida, USA
23. Kim H.C., and Alford T.L. J. Appl. Phys. 94 (2003) 5393
24. Hansen M. Constitution of Binary Alloys (1958), McGraw-Hill, New York 49
25. Janek J., Mogwitz B., Beck G., Kreutzbruck M., Kienle L., and Korte C. Prog. Solid State Chem. 32 (2004) 179
26. Srolovitz D.J., and Safran S.A. J. Appl. Phys. 60 (1986) 247
27. Wong H., Voorhees P.W., Miksis M.J., and Davis S.H. J. Appl. Phys. 81 (1997) 6091
28. Nolan T.P., Sinclair R., and Beyers R. J. Appl. Phys. 71 (1992) 720
29. Rha J.J., and Park J.K. J. Appl. Phys. 82 (1997) 1608
30. Sharma S.K., and Spitz J. Thin Solid Films 65 (1980) 339
31. Sieradzki K., Bailey K., and Alford T.L. Appl. Phys. Lett. 79 (2001) 3401
32. Kwon J., Yoon T., Kim K., and Min S. J. Appl. Phys. 93 (2003) 3270
33. Alford T.L., Chen L., and Gadre K.S. Thin Solid Films 429 (2003) 248
34. Saito Y., Sato M., and Shiojiri M. Thin Solid Films 79 (1981) 257