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Volumn 246, Issue 7, 2009, Pages 1459-1469

Methodology for the structural characterisation of VxOy species supported on silica under reaction conditions by means of in situ O K-edge X-ray absorption spectroscopy

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Indexed keywords


EID: 67849122842     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200945067     Document Type: Article
Times cited : (39)

References (47)
  • 42
    • 4444345521 scopus 로고    scopus 로고
    • Weckhuysen B.M. (Ed.), (American Scientific Publishers)
    • B. M. Weckhuysen (Ed.), In-situ Spectroscopy of Catalysts (American Scientific Publishers, 2004).
    • (2004) In-situ Spectroscopy of Catalysts


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.