Surface engineering: A low wearing solution for metal-on-metal hip surface replacements

Journal of Biomedical Materials Research - Part B Applied Biomaterials

Volumn 90 B, Issue 2, 2009, Pages 558-565

  Leslie, Ian J ^a   Williams, Sophie ^a   Brown, Chris ^a   Anderson, James ^b   Isaac, Graham ^a,b   Hatto, Peter ^c   Ingham, Eileen ^a   Fisher, John ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

^b Synthes Technical Center   (United Kingdom)

^c No 1 Industrial Estate   (United Kingdom)

Author keywords

Hip prosthesis; Metal ions; Surface modification; Wear; Wear debris

Indexed keywords

BEARINGS (STRUCTURAL); CHROMIUM; DEBRIS; FIELD EMISSION; HIP PROSTHESES; INDUCTIVELY COUPLED PLASMA; MASS SPECTROMETRY; METAL IONS; METHOD OF MOMENTS; NITRIDES; NONMETALLIC BEARINGS; PLASMA DEPOSITION; PROSTHETICS; SCANNING ELECTRON MICROSCOPY; SURFACE ANALYSIS; SURFACE TREATMENT; TRACE ANALYSIS; VAPORS;

ARC EVAPORATION; CERAMIC BEARING; CHROMIUM NITRIDE; COATED SURFACE; CRN COATING; FIELD EMISSION GUNS; HIP SIMULATOR STUDIES; INDUCTIVELY COUPLED PLASMA MASS SPECTROSCOPIES; ION RELEASE; METAL SUBSTRATE; METAL WEAR; METAL-ON-METAL; NANOMETER SIZE RANGE; PERCEIVED RISK; SERUM LEVELS; SURFACE ENGINEERING; SURFACE MODIFICATION; WEAR; WEAR DEBRIS; WEAR PARTICLES;

METALS;

CHROMIUM DERIVATIVE; CHROMIUM NITRIDE; ION; UNCLASSIFIED DRUG;

ARTICLE; BIOENGINEERING; BONE PROSTHESIS; CONTROLLED STUDY; EVAPORATION; FIELD EMISSION; HIP ARTHROPLASTY; MEASUREMENT; MORPHOLOGY; PARTICLE SIZE; SCANNING ELECTRON MICROSCOPY; SIMULATOR; SURFACE PROPERTY; THICKNESS; VAPOR;

EID: 67749145816     PISSN: 15524973     EISSN: 15524981     Source Type: Journal    
DOI: 10.1002/jbm.b.31317     Document Type: Article

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