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Applied Physics A: Materials Science and Processing

Volumn 96, Issue 3, 2009, Pages 671-677

Quantitative Lorentz transmission electron microscopy of structured thin permalloy films

(2) Nepijko, S A a,b Schonhense G a

a JOHANNES GUTENBERG UNIVERSITY (Germany)

b INSTITUTE OF PHYSICS (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

DEFOCUSING; FERROMAGNETIC PARTICLES; LANDAU-LIFSHITZ; LORENTZ MICROSCOPIES; LORENTZ TRANSMISSION ELECTRON MICROSCOPY; MAGNETIC CONTRAST; MAGNETIC INDUCTION; RECTANGULAR PARTICLE; STRAY FIELD; THIN PERMALLOY FILMS; TRANSMISSION ELECTRON MICROSCOPE;

ELECTRON MICROSCOPES; MAGNETIC FIELDS; MULTILAYERS; NEON; TRANSMISSION ELECTRON MICROSCOPY;

MAGNETIC DOMAINS;

EID: 67651241071 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s00339-009-5131-4 Document Type: Article

Times cited : (9)

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