In situ measurements of magnetoresistive effects in ferromagnetic microstructures by Lorentz microscopy

Applied Physics Letters

Volumn 88, Issue 8, 2006, Pages

  Haug, T ^a   Vogl, A ^a   Zweck, J ^a   Back, C H ^a  

^a UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FRESNEL IMAGING; LORENTZ MICROSCOPY; MAGNETIC RESOLUTION; POINT RESISTANCE;

FERROMAGNETIC MATERIALS; IMAGING SYSTEMS; MAGNETIC DOMAINS; MICROSTRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

MAGNETORESISTANCE;

EID: 33644538262     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2179367     Document Type: Article

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