Stress-induced phase transformation and pseudo-elastic/pseudo-plastic recovery in intermetallic Ni-Al nanowires

Nanotechnology

Volumn 20, Issue 29, 2009, Pages

  Sutrakar, Vijay Kumar ^a,b   Mahapatra, D Roy ^b  

^a Aeronautical Development Establishment Bangalore   (India)

^b INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

B2 PHASE; EMBEDDED-ATOM METHOD POTENTIALS; MOLECULAR DYNAMICS SIMULATIONS; NANOSCALE DEVICE; PHASE TRANSFORMATION; PLASTIC STRAIN RECOVERY; RECOVERABLE STRAIN; SHAPE MEMORY; STRAIN SENSING; STRESS INDUCED PHASE TRANSFORMATIONS; STRESS-INDUCED; STRUCTURAL AND MECHANICAL PROPERTIES; TEMPERATURE RANGE;

ELASTIC CONSTANTS; ELASTIC MODULI; ELECTRIC WIRE; INTERMETALLICS; MECHANICAL PROPERTIES; MOLECULAR DYNAMICS; NANOWIRES; PHASE TRANSITIONS; PLASTICS; POLYCRYSTALLINE MATERIALS; YIELD STRESS;

STRAIN RATE;

ALUMINUM; NANOMATERIAL; NANOWIRE; NICKEL; PLASTIC;

ARTICLE; CONTROLLED STUDY; ELASTIC FIBER; EMBEDDED ATOM METHOD; MOLECULAR DYNAMICS; NANOTECHNOLOGY; PARAMETRIC TEST; PHASE TRANSITION; PRIORITY JOURNAL; SIMULATION; STRESS; TEMPERATURE SENSITIVITY; YOUNG MODULUS; CHEMICAL MODEL; CHEMISTRY; COMPUTER SIMULATION; ELASTICITY; MECHANICAL STRESS; METHODOLOGY; PARTICLE SIZE; TEMPERATURE;

ALUMINUM; COMPUTER SIMULATION; ELASTICITY; MODELS, CHEMICAL; NANOTECHNOLOGY; NANOWIRES; NICKEL; PARTICLE SIZE; PHASE TRANSITION; PLASTICS; STRESS, MECHANICAL; TEMPERATURE;

EID: 67651208581     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/29/295705     Document Type: Article

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