Loss reduction of waveguide crossings by wavefront matching method and their application to integrated optical circuits

Journal of Lightwave Technology

Volumn 27, Issue 13, 2009, Pages 2257-2263

  Sakamaki, Yohei ^a   Saida, Takashi ^a   Hashimoto, Toshikazu ^a   Kamei, Shin ^a   Takahashi, Hiroshi ^a  

^a NTT CORPORATION   (Japan)

Author keywords

Design methodology; Optical planar waveguides; Waveguide junctions

Indexed keywords

DESIGN METHOD; DESIGN METHODOLOGY; EXPERIMENTAL CONFIRMATION; HIGH-DENSITY INTEGRATION; HIGHLY INTEGRATED; INTEGRATED OPTICAL CIRCUIT; LOSS CHARACTERISTICS; LOSS REDUCTION; OPTICAL PLANAR WAVEGUIDES; PLANAR LIGHTWAVE CIRCUIT TECHNOLOGY; STRAIGHT WAVEGUIDES; TEST CIRCUIT; VARIABLE OPTICAL ATTENUATORS; WAVEFRONT-MATCHING METHOD; WAVEGUIDE CROSSINGS; WAVELENGTH MULTIPLEXERS;

DESIGN; ELECTROMAGNETIC WAVE ATTENUATION; PLANAR WAVEGUIDES; SILICA; WAVEFRONTS; WAVEGUIDE ATTENUATORS; WAVEGUIDE JUNCTIONS;

CROSSINGS (PIPE AND CABLE);

EID: 67651122803     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2008.2006411     Document Type: Article

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