Soft computing techniques for free-space measurements of complex dielectric constant

Applied Computational Electromagnetics Society Journal

Volumn 24, Issue 3, 2009, Pages 318-325

  Escot, D ^a   Poyatos, D ^a   Montiel, I ^a   Patricio, M A ^b  

^a Laboratorio de Detectabilidad   (Spain)

^b UNIVERSIDAD CARLOS III DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL NEURAL NETWORK; CHEMICAL CONCENTRATIONS; COMPLEX DIELECTRIC CONSTANT; COMPUTING ALGORITHMS; FREE SPACE MEASUREMENTS; MATERIAL CHARACTERISTICS; MOISTURE CONTENTS; NOVEL METHODS; SOFTCOMPUTING TECHNIQUES; SYNTHETIC MATERIALS;

BACKPROPAGATION; CERAMIC CAPACITORS; COMPUTATION THEORY; DIELECTRIC PROPERTIES; MATERIALS PROPERTIES; NEURAL NETWORKS; PARTICLE SWARM OPTIMIZATION (PSO); SOFT COMPUTING;

DIELECTRIC MATERIALS;

EID: 67651071342     PISSN: 10544887     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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