Toward accurate and fast iris segmentation for iris biometrics

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 31, Issue 9, 2009, Pages 1670-1684

  He, Zhaofeng ^a   Tan, Tieniu ^a   Sun, Zhenan ^a   Qiu, Xianchao ^a  

^a INSTITUTE OF AUTOMATION   (China)

Author keywords

Biometrics; Edge fitting; Eyelash and shadow detection; Eyelid localization; Iris segmentation; Reflection removal

Indexed keywords

ADABOOST; ADAPTIVE THRESHOLDS; EDGE FITTING; EDGE POINT; ELASTIC MODELS; EXHAUSTIVE SEARCH; EYELASH AND SHADOW DETECTION; EYELID LOCALIZATION; HISTOGRAM FILTER; HOOKE'S LAW; IMAGE REGIONS; INTENSITY DISTRIBUTION; IRIS BIOMETRICS; IRIS IMAGES; IRIS RECOGNITION; IRIS SEGMENTATION; IRIS SEGMENTATION METHOD; NOISE ELIMINATION; NON-CIRCULAR; NOVEL ALGORITHM; PARAMETER SPACES; PREDICTION MODEL; RANK FILTERS; RESTORING FORCES; SHADOW DETECTIONS; SHAPE IRREGULARITY; SMOOTHING SPLINE; STATE-OF-THE-ART METHODS;

ADAPTIVE BOOSTING; ALGORITHMS; BIOMETRICS; CURVE FITTING; DETECTORS; FEATURE EXTRACTION; IMAGE SEGMENTATION; MATHEMATICAL MODELS; REFLECTION;

EDGE DETECTION;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; BIOMETRY; COMPUTER ASSISTED DIAGNOSIS; HISTOLOGY; HUMAN; IMAGE ENHANCEMENT; IMAGE SUBTRACTION; IRIS; METHODOLOGY;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; BIOMETRY; HUMANS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IRIS; PATTERN RECOGNITION, AUTOMATED; SUBTRACTION TECHNIQUE;

EID: 67651002245     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2008.183     Document Type: Article

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