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Volumn 108, Issue 1-2, 2009, Pages 46-53

Preliminary indications from atomic force microscopy of the presence of rapidly-formed nanoscale films on aquifer material surfaces

Author keywords

Colloids; Force microscopy; Groundwater; Sorption; Surface films

Indexed keywords

AFM PROBE; AQUIFER MATERIALS; CLEAVAGE PLANE; DEEP GROUNDWATERS; FORCE INTERACTION; FORCE MICROSCOPY; HIGH-RESOLUTION IMAGING; MICA SURFACES; MUSCOVITE MICA; NANO-SCALE SURFACES; NANOMETRES; NANOSCALE FILMS; NATURAL ATTENUATION; NON-AQUEOUS; NONAQUEOUS PHASE LIQUIDS; PARTICULATE PHASIS; PATCHY SURFACES; PURE WATER; REDOX INTERACTIONS; SANDSTONE AQUIFER; SOIL WATER; SURFACE FILMS; SYNTHETIC GROUNDWATER; WETTING ANGLE;

EID: 67650735157     PISSN: 01697722     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jconhyd.2009.05.006     Document Type: Article
Times cited : (11)

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