Diffusion through a polycrystalline thin film

Applied Physics A: Materials Science and Processing

Volumn 96, Issue 2, 2009, Pages 515-520

  Liu, Lilin ^a   Zhang, Tongyi ^b  

^a SUN YAT SEN UNIVERSITY   (China)

^b HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC SOLUTION; ANALYTICAL SOLUTIONS; CONCENTRATION PROFILES; DEPTH PROFILE; FICK'S SECOND LAW; GRAIN INTERIORS; PARABOLIC PROFILES; POLYCRYSTALLINE THIN FILM; TIME LAG;

DIFFUSION; GRAIN BOUNDARIES; LEAD; SURFACE DIFFUSION; THIN FILM DEVICES; THIN FILMS;

GRAIN SIZE AND SHAPE;

EID: 67650409975     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-009-5213-3     Document Type: Article

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