Studies on organic light-emitting diodes based on rubrene-doped zinc quinolate

Physica Status Solidi (A) Applications and Materials Science

Volumn 206, Issue 7, 2009, Pages 1660-1663

  Saxena, Kanchan ^a   Mehta, Dalip Singh ^b   Rai, Virender Kumar ^c   Srivastava, Ritu ^c   Chauhan, Gayatri ^c   Kamalasanan, M N ^c   Jain, V K ^a  

^a AMITY UNIVERSITY   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

^c NATIONAL PHYSICAL LABORATORY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CONCENTRATION OF; DEVICE PERFORMANCE; DEVICE STRUCTURES; DOPED DEVICES; DRIVE VOLTAGE; ELECTROLUMINESCENCE SPECTRA; ELECTRON TRANSPORT LAYERS; ELECTRON-INJECTION LAYERS; EMISSION LAYERS; EMISSIVE LAYERS; ENHANCED ELECTROLUMINESCENCES; HIGH EFFICIENCY; HOLE TRANSPORT LAYERS; INDIUM TIN OXIDE; METAL CHELATE; OXYGEN PLASMAS; PEAK SHIFTING; QUINOLATE; RUBRENE; SPECTRAL BROADENING; SPECTRAL PEAK; WEIGHT PERCENT;

ALUMINA; AMINES; CHELATION; CONDUCTIVE FILMS; CURRENT DENSITY; DOPING (ADDITIVES); ELECTRIC POTENTIAL; ELECTROLUMINESCENCE; ELECTRON TRANSPORT PROPERTIES; HELMET MOUNTED DISPLAYS; LIGHT; LIGHT EMISSION; LIGHT EMITTING DIODES; OXYGEN; TIN; ZINC;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 67650354192     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200824516     Document Type: Article

References (28)

1. C. W. Tang and S. A. VanSlyke, Appl. Phys. Lett. 51, 913 (1987).
2. H. S. Nalwa and L. S. Rohwer (eds.), Handbook of Luminescence, Display Materials and Devices, Vol. 1 (ASP Press, California, USA, 2003).
3. J. R. Sheats, H. Antoniadis, M. Hueschen, W. Leonard, J. Miller, R. Moon, D. Roitman, and A. Stocking, Science 273, 884 (1996).
4. M. A. Baldo, D. F. O'Brien, Y. J. You, A. Shoustikov, S. Sibley, M. E. Thompson, and S. R. Forrest, Nature 395, 151 (1998).
5. Y. Cao, I. D. Parker, G. Yu, C. Zhang, and A. J. Heeger, Nature 397, 414 (1999).
6. C. D. Müller, A. Falcou, N. Reckefuss, M. Rojahn, V. Wie-derhim, P. Rudati, H. Frohne, O. Nuyken, H. Becker, and K. Meerholz, Nature 421, 829 (2003).
7. C. W. Tang, S. A. VanSlyke, and C. H. Chen, J. Appl. Phys. 65, 3610 (1989).
8. F. Pschenitzka and J. C. Sturm, Proc. SPIE 4105, 59 (2001).
9. H. Murata, C. D. Merrit, and Z. H. Kafafi, IEEE J. Sel. Top. Quantum Electron. 4, 119 (1998).
10. A. A. Shoudtikov, Y. J. You, and M. E. Thompson, IEEE J. Sel. Top. Quantum Electron. 4, 3 (1998).
11. S. Kundu, K. Fujihara, T. Okada, and M. Matsumura, Jpn. J. Appl. Phys. 39, 5297 (2000).
12. Y. Hamada, H. Kanno, T. Tsujioka, H. Takahashi, and T. Usuki, Appl. Phys. Lett. 75, 1682 (1999).
13. G. He, J. Liu, Y. Li, and Y. Yang, Appl. Phys. Lett. 80, 1891 (2002).
14. Y.-H. Niu, A. K.-Y. Jen, and C. Shu, J. Phys. Chem. B 110, 6010 (2006).
15. Q. Niu, Y. Zhou, L. Wang, J. Peng, J. Wang, J. Pei, and Y. Cao, Adv. Mater. 20, 964 (2008).
16. M. A. Baldo, Nature 403, 750 (2000).
17. X. Q. Lin, B. J. Chen, X. H. Zhang, C. S. Lee, H. L. Kwong, and S. T. Lee, Chem. Mater. 13, 456 (2001).
18. C. Adachi, M. A. Baldo, M. E. Thompson, and S. R. Forrest, J. Appl. Phys. 90, 5048 (2001).
19. Y. Sun, N. C. Giebink, H. Kanno, B. Ma, M. E. Thompson, and S. R. Forrest, Nature 440, 908 (2006).
20. N. K. Patel, S. Cinà, and J. H. Burroughes, IEEE J. Select. Top. Quant. Electron. 8, 346 (2002).
21. K. Saxena, D. S. Mehta, R. Srivastava, and M. N. Kamalasanan, J. Phys. D 41, 015102 (2008).
22. K. Saxena, D. S. Mehta, V. K. Rai, R. Srivastava, G. Chauhan, and M. N. Kamalasanan, J. Lumin. 128, 525 (2008).
23. J. Blochwitz, M. Pfeiffer, T. Fritz, and K. Leo, Appl. Phys. Lett. 73, 729 (1998).
24. H. W. Yang, Y. B. Yoon, T. W. Kim, K. D. Kwack, J. H. Kim, J. H. Seo, and Y. K. Kim, Solid State Commun. 137, 87 (2006).
25. G. Sakamoto, C. Adachi, T. Koyama, Y. Taniguchi, C. D. Merritt, H. Murata, and Z. H. Kafafi, Appl. Phys. Lett. 75, 766 (1999).
26. N. Donzé, P. Péchy, M. Gräetzel, M. Schaer, and L. Zuppiroli, Chem. Phys. Lett. 315, 405 (1999).
27. L. Sapochak, F. E. Benincasa, R. S. Schofield, J. L. Baker, K. K. C. Riccio, D. Fogarty, H. Kohlmann, K. F. Ferris, and P. E. Burrows, J. Am. Chem. Soc. 124, 6119 (2002).
28. Y. Hamada, T. Sano, M. Fujita, T. Fujii, Y. Nishio, and K. Shibata, Jpn. J. Appl. Phys. 32, L514 (1993).