X-ray diffraction, Raman, and photoacoustic studies of ZnTe nanocrystals

Journal of Applied Physics

Volumn 105, Issue 12, 2009, Pages

  Ersching, K ^a   Campos, C E M ^a   De Lima, J C ^a   Grandi, T A ^a   Souza, S M ^a   Da Silva, D L ^a   Pizani, P S ^b  

^a FEDERAL UNIVERSITY OF SANTA CATARINA   (Brazil)

^b FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALED SAMPLES; AS-MILLED POWDERS; CARRIER DIFFUSIONS; CRYSTALLINE PHASE; CRYSTALLINE PHASIS; DEFECT-FREE; HEAT TRANSFER MECHANISM; LONGITUDINAL OPTICAL PHONONS; MICROSTRAINS; NANOCRYSTALLINE; NON-RADIATIVE; PHASE FRACTIONS; PHOTOACOUSTIC ABSORPTION; RECOMBINATION TIME; STRUCTURAL PARAMETER; SURFACE RECOMBINATION VELOCITIES; SURFACE RECOMBINATIONS; THERMAL BENDING; THERMAL DIFFUSIVITY COEFFICIENT; THERMAL PROPERTIES; THIRD ORDER; X-RAY PATTERNS; XRD; ZINC-BLENDE; ZNO;

ANNEALING; CRYSTALLINE MATERIALS; DIFFRACTION; MECHANICAL ALLOYING; MECHANICAL PROPERTIES; METALLURGY; OPTICAL PROPERTIES; PHOTOACOUSTIC EFFECT; PHOTOACOUSTIC SPECTROSCOPY; RAMAN SPECTROSCOPY; RIETVELD ANALYSIS; RIETVELD METHOD; SEMICONDUCTING ZINC COMPOUNDS; SURFACE DIFFUSION; TELLURIUM; TELLURIUM COMPOUNDS; THERMODYNAMIC PROPERTIES; X RAY DIFFRACTION; ZINC; ZINC OXIDE;

ABSORPTION SPECTROSCOPY;

EID: 67650221283     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3155887     Document Type: Conference Paper

References (30)

1. TAPP, Version 2.2, E. S. Microwave, Inc., Wade Court, Hamilton, OH.
2. R. Aleksiejunas, T. Malinauskas, M. Sudzius, K. Jarasiunas, N. Lovergine, M. Traversa, P. Prete, A. M. Mancini, and T. Asahi, Proceedings of the Tenth European Workshop on MOVPE, Lecce, Italy, 8-11 June 2003 (unpublished).
3. W. S. Kuhn, A. Lusson, B. Qu Hen, C. Grattepain, H. Dumont, O. Gorochov, S. Bauer, K. Wolf, M. Wörz, T. Reisinger, A. Rosenauer, H. P. Wagner, H. Stanzl, and W. Gebhardt, Prog. Cryst. Growth Charact. Mater. 0960-8974 31, 119 (1995). 10.1016/0960-8974(95)00018-6
4. T. Ishizaki, T. Ohtomo, and A. Fuwa, J. Phys. D 0022-3727 37, 255 (2004). 10.1088/0022-3727/37/2/014
5. Y. D. Li, D. Yi, and Z. Y. Yu, Adv. Mater. (Weinheim, Ger.) 0935-9648 11, 847 (1999). 10.1002/(SICI)1521-4095(199907)11:10<847::AID-ADMA847>3.0. CO;2-B
6. J. Du, L. Xu, G. Zou, L. Chai, and Y. Qian, J. Cryst. Growth 0022-0248 291, 183 (2006). 10.1016/j.jcrysgro.2006.02.040
7. A. K. S. Aqili, Z. Ali, and A. Maqsood, Appl. Surf. Sci. 0169-4332 167, 1 (2000). 10.1016/S0169-4332(00)00498-0
8. R. L. Gunshor, L. A. Koladziejski, N. Otsuka, and S. Dutta, Surf. Sci. 0039-6028 174, 522 (1986). 10.1016/0039-6028(86)90464-4
9. H. Bellakhder, A. Outzourhit, and E. L. Ameziane, Thin Solid Films 0040-6090 382, 30 (2001). 10.1016/S0040-6090(00)01697-7
10. C. E. M. Campos, J. C. de Lima, T. A. Grandi, and H. Höhn, J. Non-Cryst. Solids 0022-3093 354, 3503 (2008). 10.1016/j.jnoncrysol.2008.03.040
11. J. C. de Lima, N. Cella, L. C. M. Miranda, C. An Chying, A. H. Franzan, and N. F. Leite, Phys. Rev. B 0163-1829 46, 14186 (1992). 10.1103/PhysRevB.46. 14186
12. V. Kishore, R. Sharma, V. K. Saraswat, N. S. Saxena, K. Sharma, and T. P. Sharma, Appl. Therm. Eng. 1359-4311 27, 1552 (2007). 10.1016/j.applthermaleng. 2006.09.017
13. S. M. Souza, D. M. Tricĥs, J. C. de Lima, T. A. Grandi, and C. E. M. Campos, J. Appl. Phys. 0021-8979 102, 063523 (2007). 10.1063/1.2784010
14. G. Ziegler and D. P. H. Hasselman, J. Mater. Sci. 0022-2461 16, 495 (1981). 10.1007/BF00738642
15. H. M. Rietveld, J. Appl. Crystallogr. 0021-8898 2, 65 (1969). 10.1107/S0021889869006558
16. A. C. Larson and R. B. Von Dreele, " General structure analysis system (GSAS).," Los Alamos National Laboratory Report No. LAUR 86-748, 2000.
17. Inorganic Crystal Structure Database (ICSD), Fachinformationszentrum Karlsruhe, Germany and the U.S. Department of Commerce on behalf of the United States, 2007.
18. P. W. Stephens, J. Appl. Crystallogr. 0021-8898 32, 281 (1999). 10.1107/S0021889898006001
19. B. D. Cullity, Elements of X-Ray Diffraction (Addison-Wesley, Reading, MA, 1978), p. 285.
20. B. K. Rai, H. D. Bist, R. S. Katiyar, K.-T. Chen, and A. Burger, J. Appl. Phys. 0021-8979 80, 477 (1996). 10.1063/1.362779
21. J. B. Renucci, Ph.D. thesis, Universit́ Paul Sabatie, 1974.
22. A. P. Mirgorodsky, T. Merle-Ḿjean, J. -C. Champarnaud, P. Thomas, and B. Frit, J. Phys. Chem. Solids 0022-3697 61, 501 (2000). 10.1016/S0022-3697(99)00263-2
23. M. Scagliotti, M. Jouanne, and M. Balkanski, Phys. Rev. B 0163-1829 31, 5343 (1985). 10.1103/PhysRevB.31.5343
24. S. Hayashi, H. Sanda, M. Agata, and K. Yamamoto, Phys. Rev. B 0163-1829 40, 5544 (1989). 10.1103/PhysRevB.40.5544
25. S. Perkowitz, L. S. Kim, Z. C. Feng, and P. Becla, Phys. Rev. B 0163-1829 42, 1455 (1990). 10.1103/PhysRevB.42.1455
26. R. L. Schmidt, B. D. McCombe, and M. Cardona, Phys. Rev. B 0556-2805 11, 746 (1975). 10.1103/PhysRevB.11.746
27. F. Decremps, J. Pellicer-Porres, A. M. Saitta, J. C. Chervin, and A. Polian, Phys. Rev. B 0163-1829 65, 092101 (2002). 10.1103/PhysRevB.65.092101
28. G. Rousset, F. Lepoutre, and L. Bertrand, J. Appl. Phys. 0021-8979 54, 2383 (1983). 10.1063/1.332352
29. K. Tsigaridis, Periodic Table of Elements, available at http://atlas.chemistry.uoc.gr/ptoe.
30. X.-D. Xu, D. Ma, S.-Y. Zhang, A.-H. Luo, and W. Kiyotaka, Chin. Phys. Lett. 0256-307X 25, 176 (2008). 10.1088/0256-307X/25/1/048