The use of Lorentz microscopy for the determination of magnetic reversal mechanism of exchange-biased Co30Fe70/NiMn bilayer

Journal of Magnetism and Magnetic Materials

Volumn 321, Issue 19, 2009, Pages 3080-3083

  Masseboeuf, A ^a   Gatel, C ^a   Bayle Guillemaud, P ^a   Lamy, Y ^a   Viala, B ^a  

^a CEA GRENOBLE   (France)

Author keywords

Exchange anisotropy; In situ magnetization; Lorentz microscopy

Indexed keywords

APPLIED FIELD; BI-LAYER; COHERENT ROTATION; DIFFERENTIAL PHASE CONTRAST; EXCHANGE ANISOTROPY; EXCHANGE-BIAS FIELDS; FIELD VALUES; IN-SITU; IN-SITU MAGNETIZATION; LORENTZ MICROSCOPIES; LORENTZ MICROSCOPY; LORENTZ TRANSMISSION ELECTRON MICROSCOPY; MAGNETIC INDUCTION; MAGNETIC MAPS; MAGNETIC REVERSAL; MICRON SCALE; POLYCRYSTALLINE; RELATIVE INTENSITY; REVERSAL MODES; REVERSAL PROCESS; SEMI-QUANTITATIVE; TEM; TRANSMISSION ELECTRON MICROSCOPE; UNIDIRECTIONAL ANISOTROPY;

ANISOTROPY; ELECTRON MICROSCOPES; HYSTERESIS; MAGNETIC MATERIALS; MAGNETIC MOMENTS; MAGNETIC PROPERTIES; MAGNETS; TRANSMISSION ELECTRON MICROSCOPY;

MAGNETIZATION REVERSAL;

EID: 67650104640     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2009.05.011     Document Type: Article

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