Aberration corrected Lorentz Microscopy for perpendicular magnetic recording media

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 832-833

  Phatak, C ^a   Bain, J A ^a   Zhu, J G ^a   De Graef, M ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549122882     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608086340     Document Type: Conference Paper

References (5)

1. G. Ju et al., IEEE Trans. Mag., 43:627632, 2007.
2. Private communication, FEI Company and CEOS, GmbH, January 2008.
3. H. Lichte., Ultramicroscopy, 38:1322, 199.
4. M. Mansuripur., J. Appl. Phys., 69:24552464, 1991.
5. This work was supported by the U.S Department of Energy, Basic Energy Sciences under contract number DE-FG02-01ER45893.