Electrical noise in gold nanoparticle chemiresistors

Proceedings of IEEE Sensors

Volumn , Issue , 2008, Pages 102-105

  Covington, Elizabeth L ^a   Turner, Richard W ^a   Kurdak, Çagliyan ^a   Rowe, Michael P ^a   Xu, Chao ^a   Zellers, Edward T ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

1/F NOISE; CHEMIRESISTORS; ELECTRICAL NOISE; ELECTRON-BEAM CROSSLINKING; GOLD NANOPARTICLES; LIMIT OF DETECTION; LOW FREQUENCY; MICRO-DISPENSING; NANOPARTICLE DEPOSITION; NOISE PERFORMANCE; NONUNIFORM; ORDERS OF MAGNITUDE; PATTERNED FILMS; PREFACTOR; THICKNESS OF THE FILM;

CROSSLINKING; ELECTRON BEAMS; GOLD DEPOSITS; MONOLAYERS; NANOFLUIDICS; NANOPARTICLES; SPURIOUS SIGNAL NOISE;

SENSORS;

EID: 67649977963     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSENS.2008.4716393     Document Type: Conference Paper

References (8)

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