Effect of inlet orifice on saturated CHF and flow visualization in multi-microchannel heat sinks

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Volumn , Issue , 2009, Pages 1-8

  Park, Jung Eung ^a   Thome, John R ^a   Michel, Bruno ^b  

^a EPFL   (Switzerland)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

Chip cooling; Critical heat flux; Flow boiling; Flow visualization; Instability; Multi microchannel

Indexed keywords

CHIP COOLING; CRITICAL HEAT FLUX; FLOW BOILING; INSTABILITY; MULTI-MICROCHANNEL;

COOLING; FLOW PATTERNS; FLOW VISUALIZATION; FLUID DYNAMICS; HEAT FLUX; HEAT SINKS; ORIFICES; STABILITY; TABLE LOOKUP; THERMAL VARIABLES MEASUREMENT;

MICROCHANNELS;

EID: 67649887121     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/STHERM.2009.4810735     Document Type: Conference Paper

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