Correlation between structure, dielectric, and ferroelectric properties in BiFeO3 - LaMnO3 solid solution thin films

Journal of Applied Physics

Volumn 105, Issue 1, 2009, Pages

  Lahmar, Abdelilah ^a   Habouti, Salah ^a   Solterbeck, Claus Henning ^a   Es Souni, Mohammed ^a   Elouadi, Brahim ^b  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

^b UNIVERSITÉ DE LA ROCHELLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SOLUTIONS; COMPARATIVE STUDIES; CURRENT MECHANISMS; DIELECTRIC ANOMALY; DOPING ELEMENTS; FERROELECTRIC PROPERTY; ORTHORHOMBIC DISTORTION; OVERALL PROPERTIES; PEROVSKITE STRUCTURES; POLARIZATION PROPERTIES; PROCESSING CONDITION; SILICON SUBSTRATES; STRUCTURAL TRANSITIONS;

ACTIVATION ENERGY; CRYSTALLIZATION; DIELECTRIC RELAXATION; FERROELECTRIC FILMS; FERROELECTRICITY; LANTHANUM; LEAKAGE (FLUID); LEAKAGE CURRENTS; MANGANESE; MANGANESE COMPOUNDS; OXIDE MINERALS; OXYGEN; OXYGEN VACANCIES; PEROVSKITE; PLATINUM; POLARIZATION; SEMICONDUCTING BISMUTH COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; SOLID SOLUTIONS; SOLIDIFICATION; THIN FILMS;

STRUCTURAL PROPERTIES;

EID: 67649763952     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3063813     Document Type: Article

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