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Volumn 3, Issue 1-2, 2008, Pages 36-41
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An empirical approach to calculate the number of atoms in column-domains by HAADF-STEM analysis: A binary approximation in the Nb16W 18O94 ternary system
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Author keywords
Column Domains; High Angle Annular Dark Field; Scanning Transmission Electron Microscopy; Z Contrast
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Indexed keywords
ATOMIC COLUMNS;
ATOMIC RESOLUTION;
ATOMIC SITES;
CHEMICAL SPECIES;
COLUMN DOMAINS;
COMPLEX OXIDES;
CRYSTALLINITY;
EMPIRICAL APPROACH;
EMPIRICAL CALCULATIONS;
HAADF-STEM;
HIGH ANGLE ANNULAR DARK FIELD;
HIGH-ANGLE ANNULAR DARK FIELD DETECTORS;
INTENSITY DISTRIBUTION;
LINE INTENSITIES;
NB ATOMS;
NONUNIFORMITY;
SCANNING TRANSMISSION ELECTRON MICROSCOPY;
SCINTILLATION DETECTORS;
STEM-HAADF;
STOICHIOMETRIC COMPOSITIONS;
SURFACE INHOMOGENEITIES;
THEORETICAL CALCULATIONS;
ULTRA-THIN;
Z-CONTRAST;
Z-CONTRAST IMAGING;
ZONE AXIS;
DEFECT STRUCTURES;
ELECTRIC FIELD MEASUREMENT;
ELECTRON MICROSCOPES;
IMAGE RECORDING;
NIOBIUM;
NIOBIUM COMPOUNDS;
SCANNING;
SCANNING ELECTRON MICROSCOPY;
STRONTIUM COMPOUNDS;
SURFACE DEFECTS;
TERNARY SYSTEMS;
TRANSMISSION ELECTRON MICROSCOPY;
ATOMS;
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EID: 67649506239
PISSN: 15577937
EISSN: None
Source Type: Journal
DOI: 10.1166/jspm.2008.002 Document Type: Article |
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Times cited : (1)
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References (10)
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