The origin of multiple dielectric relaxation processes in Fe-substituted CaCu3Ti4O12 ceramics

Materials Science and Engineering: B

Volumn 162, Issue 3, 2009, Pages 195-199

  Mu, Chunhong ^a   Zhang, Huaiwu ^a   He, Ying ^a   Liu, Peng ^b   Shen, Jian ^c  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b SHAANXI NORMAL UNIVERSITY   (China)

^c UNIVERSITY OF DELAWARE   (United States)

Author keywords

Ceramics; Dielectric relaxation; Doping effects; Impedance; Surface roughnesses

Indexed keywords

CALCIUM COMPOUNDS; CERAMIC MATERIALS; COPPER COMPOUNDS; DIELECTRIC RELAXATION; GRAIN BOUNDARIES; IRON COMPOUNDS; PERMITTIVITY; SOLID STATE REACTIONS; TITANIUM COMPOUNDS;

CERAMIC; DIELECTRIC RELAXATION PROCESS; DOPING EFFECTS; FE 3+; FE-SUBSTITUTED; FREQUENCY RANGES; GIANT DIELECTRIC CONSTANTS; GRAIN-BOUNDARIES; IMPEDANCE; SOLID STATE REACTION METHOD;

SURFACE ROUGHNESS;

EID: 67649439151     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2009.04.012     Document Type: Article

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