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Volumn 34, Issue 12, 2009, Pages 1750-1752
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Phase contrast coherence microscopy based on transverse scanning
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Author keywords
[No Author keywords available]
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Indexed keywords
OPTICAL TOMOGRAPHY;
EN-FACE IMAGING;
FAST MOTIONS;
FAST SCANNING;
HIGH FREQUENCY HF;
OPTICAL PATH LENGTHS;
PHASE CHANGE;
PHASE CONTRASTS;
SCANNING BEAMS;
SCANNING;
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EID: 67649386885
PISSN: 01469592
EISSN: 15394794
Source Type: Journal
DOI: 10.1364/OL.34.001750 Document Type: Article |
Times cited : (13)
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References (8)
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