Modelling of nanoindentation of compliant layers on stiffer substrates using finite element analysis

Materials Research Society Symposium Proceedings

Volumn 1025, Issue , 2008, Pages 46-51

  Clifford, Charles A ^a   Seah, Martin P ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; COMPLIANT LAYER; FINITE ELEMENT ANALYSIS; INDENTATION DEPTH; INDENTER; NANOINDENTER; POISSON'S RATIO; REDUCED MODULUS;

FINITE ELEMENT METHOD; FUNCTIONAL MATERIALS; NANOINDENTATION; POISSON RATIO; SCANNING PROBE MICROSCOPY; VICKERS HARDNESS TESTING;

SUBSTRATES;

EID: 67649342922     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. Clifford C A and Seah M P 2005 Appl Surf Sci 252 1915.
2. Sader J 2002 Encyclopedia of Surface and Colloid Science, Ed: Hubbard A, 846.
3. Clifford C A and Seah M P2005 Nanotechnology 16 1666.
4. Bückle H 1961 VDI Berichte 41 14.
5. Hertz H 1881 J. Reine und Angewandie Mathernatik 92 156
6. Clifford C A and Seah M P2006 Nanotechnology 17 5283.
7. Clifford C A and Seah M P 2008, to be published.