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The SAED pattern for the oriented architecture of KAP/ PAA could not be obtained by TEM analysis because there were many more transmission than diffraction electrons in the organic materials. If the ca. 20 nm nanocrystals randomly aggregated, the peak broadening should be observed in the XRD pattern. But in fact, the orientation of the nanocrystals led to the appearance of sharpened peaks Figure 1e
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The SAED pattern for the oriented architecture of KAP/ PAA could not be obtained by TEM analysis because there were many more transmission than diffraction electrons in the organic materials. If the ca. 20 nm nanocrystals randomly aggregated, the peak broadening should be observed in the XRD pattern. But in fact, the orientation of the nanocrystals led to the appearance of sharpened peaks (Figure 1e).
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