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Volumn 74, Issue 11, 2007, Pages 572-576

Chirp calibration standards for surface measuring instruments;Chirp-Kalibriernormale für Oberflächenmessgeräte

Author keywords

Confocal microscope; Contact stylus instrument; Interference microscope; Measurement standard

Indexed keywords

CALIBRATION STANDARD; CONTACT STYLUS INSTRUMENTS; INTERFERENCE MICROSCOPES; MANUFACTURING PROCESS; MEASUREMENT STANDARDS; MEASURING INSTRUMENTS; MORPHOLOGICAL OPERATIONS; SCALED FREQUENCIES;

EID: 67649299266     PISSN: 01718096     EISSN: None     Source Type: Journal    
DOI: 10.1524/teme.2007.74.11.572     Document Type: Article
Times cited : (50)

References (10)
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    • P. de Groot, X. Colonna de Lega: Interpreting interferometric height measurements using the instrument transfer function. Proc. FRINGE 2006, W. Osten (Ed.), 30-37, Springer Verlag, 2006.
    • P. de Groot, X. Colonna de Lega: Interpreting interferometric height measurements using the instrument transfer function. Proc. FRINGE 2006, W. Osten (Ed.), 30-37, Springer Verlag, 2006.
  • 5
    • 0028466363 scopus 로고
    • Morphological filtering: An overview
    • J. Serra: Morphological filtering: an overview. Signal Processing 38 3 (1994).
    • (1994) Signal Processing , vol.38 , pp. 3
    • Serra, J.1
  • 6
    • 1842440970 scopus 로고    scopus 로고
    • Recent advances in separation of roughness, waviness and form
    • J. Raja et al.: Recent advances in separation of roughness, waviness and form. Precision Engineering 5247 1-14 (2002).
    • (2002) Precision Engineering , vol.5247 , pp. 1-14
    • Raja, J.1
  • 7
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    • ISO/TS 16610:2006(E): Geometrical product specifications (GPS) - Filtration, Part 1: Overview and basic concepts, Part 40: Morphological profile filters: Basic concepts, Part 49: Morphological profile filters: Scale space techniques.
    • ISO/TS 16610:2006(E): Geometrical product specifications (GPS) - Filtration, Part 1: Overview and basic concepts, Part 40: Morphological profile filters: Basic concepts, Part 49: Morphological profile filters: Scale space techniques.
  • 9
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    • W. Hillmann, V Jäger and M. Krystek: Superfeine Raunormale mit unregelmäbβigem Profil zum Kalibrieren von mechanisch und optisch antastenden Oberflächenmessgeräten. QZ. 42 1 76-69 (1997).
    • W. Hillmann, V Jäger and M. Krystek: Superfeine Raunormale mit unregelmäbβigem Profil zum Kalibrieren von mechanisch und optisch antastenden Oberflächenmessgeräten. QZ. 42 1 76-69 (1997).
  • 10
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    • Internet-Seite des Fachbereiches Mikro- und Nano- metrologie
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.