|
Volumn 56, Issue 3, 2009, Pages 832-835
|
The X-ray spectroscopic performance of a very large area silicon drift detector
|
Author keywords
Performance evaluation; Silicon drift detector; X ray spectroscopy
|
Indexed keywords
BIASING CONDITIONS;
ELECTRODE GEOMETRIES;
ENERGY RESOLUTIONS;
HIGH-ENERGY RESOLUTION;
LOW ENERGY X RAYS;
LOW-ENERGY X-RAY SPECTROSCOPY;
NOISE PERFORMANCE;
NOISE SOURCE;
PERFORMANCE EVALUATION;
SENSITIVE AREA;
SILICON DRIFT DETECTOR;
SILICON DETECTORS;
SPECTRUM ANALYSIS;
X RAY SPECTROMETERS;
X RAY SPECTROSCOPY;
X RAYS;
METAL DETECTORS;
|
EID: 67649220880
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: 10.1109/TNS.2008.2007955 Document Type: Article |
Times cited : (27)
|
References (7)
|