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Volumn , Issue , 2008, Pages 1232-1235
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Fabrication and comparison Gd202S(Tb) and CsI(TI) films for X-ray imaging detector application
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Author keywords
[No Author keywords available]
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Indexed keywords
CCD SENSORS;
COLUMNAR STRUCTURES;
DIGITAL X-RAY IMAGING SYSTEMS;
EMISSION SPECTRUMS;
GADOLINIUM OXYSULFIDES;
HARDENING AGENT;
IMAGING PERFORMANCE;
INDIRECT DETECTION;
INDUSTRIAL FIELDS;
LIGHT RESPONSE;
LIGHT YIELD;
LINEAR RELATIONSHIPS;
LUMINESCENT INTENSITY;
MEDICAL DIAGNOSIS;
ORGANIC ADDITIVES;
PHOTODIODE ARRAYS;
SCINTILLATION MATERIALS;
SCINTILLATION PROPERTIES;
SCINTILLATOR FILMS;
SPATIAL RESOLUTION;
THALLIUM DOPED CESIUM IODIDE;
THERMAL EVAPORATION METHOD;
THERMAL HARDENING;
TI FILM;
X RAY IMAGING SYSTEM;
X RAY LUMINESCENCE;
X-RAY CONVERTERS;
X-RAY DOSE;
X-RAY IMAGING DETECTOR;
ACOUSTIC INTENSITY;
CESIUM;
CESIUM COMPOUNDS;
CHARGE COUPLED DEVICES;
COMPUTERIZED TOMOGRAPHY;
DIAGNOSIS;
DISPERSION HARDENING;
EMISSION SPECTROSCOPY;
GADOLINIUM;
IMAGE RESOLUTION;
IMAGING SYSTEMS;
LIGHT;
LUMINESCENCE;
OPTOELECTRONIC DEVICES;
SCINTILLATION;
SCINTILLATION COUNTERS;
SENSORS;
SIGNAL TO NOISE RATIO;
TERBIUM;
TERBIUM ALLOYS;
THALLIUM;
THERMAL EVAPORATION;
X RAY ANALYSIS;
X RAYS;
X RAY RADIOGRAPHY;
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EID: 67649212004
PISSN: 10957863
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/NSSMIC.2008.4774627 Document Type: Conference Paper |
Times cited : (9)
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References (7)
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