|
Volumn , Issue , 2008, Pages 1567-1571
|
Femtosecond radiation experiment detector for X-ray free-electron laser (XFEL) coherent X-ray imaging
|
Author keywords
[No Author keywords available]
|
Indexed keywords
COHERENT X-RAY;
CORNELL UNIVERSITY;
DAMAGE MEASUREMENT;
DIFFRACTION DATA;
FEMTOSECOND PULSE;
FEMTOSECOND RADIATION;
FEMTOSECOND TIME SCALE;
FRAME RATE;
GAIN PATTERNS;
HIGH RESISTIVITY SILICON;
LINAC COHERENT LIGHT SOURCE;
LOW NOISE;
NOISE PERFORMANCE;
PIXEL ARRAYS;
PIXEL POINTS;
PIXEL SIZE;
RESPONSE PROFILE;
SINGLE PHOTON SENSITIVITY;
SINGLE PHOTONS;
STANFORD LINEAR ACCELERATOR CENTER;
X-RAY FREE ELECTRON LASERS;
X-RAY TESTING;
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
DETECTORS;
DIFFRACTION;
DIODES;
ELECTROMAGNETIC PULSE;
HOLOGRAPHIC INTERFEROMETRY;
LIGHT;
LIGHT SOURCES;
LINEAR ACCELERATORS;
OPTICAL TRANSFER FUNCTION;
PARTICLE BEAMS;
PHOTONS;
PULSED LASER APPLICATIONS;
SEMICONDUCTING SILICON COMPOUNDS;
X RAY ANALYSIS;
X RAY LASERS;
X RAYS;
PIXELS;
|
EID: 67649206313
PISSN: 10957863
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/NSSMIC.2008.4774709 Document Type: Conference Paper |
Times cited : (3)
|
References (5)
|