Probing surface plasmons in individual Ag nanoparticles in the ultra-violet spectral regime

Nanotechnology

Volumn 20, Issue 23, 2009, Pages

  Chu, Ming Wen ^a   Sharma, Pradeep ^a,b,c   Chang, Ching Pin ^a   Liou, Sz Chian ^a   Tsai, Kun Tong ^b   Wang, Juen Kai ^a,b   Wang, Yuh Lin ^a,b   Chen, Cheng Hsuan ^a,b  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b INSTITUTE OF ATOMIC AND MOLECULAR SCIENCES   (Taiwan)

^c ACADEMIA SINICA   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AG NANOPARTICLE; MOLECULAR SENSING; NANO-MATERIALS; NEAR-FIELD DISTRIBUTION; NEAR-FIELD ENHANCEMENT; PLASMONICS; POTENTIAL APPLICATIONS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SURFACE PLASMONS; ULTRA-VIOLET;

AUGER ELECTRON SPECTROSCOPY; ELECTRON BEAMS; ELECTRON ENERGY LOSS SPECTROSCOPY; NANOPARTICLES; OPTICAL DATA STORAGE; PLASMONS; SCANNING ELECTRON MICROSCOPY; SURFACE PLASMON RESONANCE; TRANSMISSION ELECTRON MICROSCOPY;

SILVER;

NANOMATERIAL; NANOPARTICLE; SILICON; SILVER;

ARTICLE; CALCULATION; EXCITATION; PRIORITY JOURNAL; REMOTE SENSING; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPECTRAL SENSITIVITY; SURFACE PLASMON RESONANCE; ULTRAVIOLET RADIATION;

EID: 67649147895     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/23/235705     Document Type: Article

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