Swift heavy ion induced structural modification of atom beam sputtered ZnO thin film

Surface and Coatings Technology

Volumn 203, Issue 17-18, 2009, Pages 2427-2431

  Agarwal, D C ^a,b   Avasthi, D K ^b   Singh, F ^b   Kabiraj, D ^b   Kulariya, P K ^b   Sulania, I ^b   Pivin, J C ^c   Chauhan, R S ^a  

^a R B S COLLEGE   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^c CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

Author keywords

Atomic force microscopy; FTIR; Ion irradiation; Power spectral density; X ray diffraction; ZnO thin film

Indexed keywords

ABSORPTION PEAKS; AFM; ATOM BEAMS; ENERGY DEPOSITIONS; FLUENCE; FLUENCES; FTIR; GRAIN SIZES; ION IRRADIATION; ROUGHNESS EXPONENTS; STRUCTURAL AND OPTICAL PROPERTIES; STRUCTURAL MODIFICATIONS; SWIFT HEAVY IONS; XRD; ZNO THIN FILM;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ATOMS; CHEMICAL MODIFICATION; DIFFRACTION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HEAVY IONS; IRRADIATION; METALLIC FILMS; OPTICAL FILMS; OPTICAL PROPERTIES; POWER SPECTRAL DENSITY; SEMICONDUCTING ZINC COMPOUNDS; SPECTROSCOPIC ANALYSIS; THIN FILM DEVICES; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC OXIDE;

SILVER;

EID: 67349234996     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2009.02.109     Document Type: Article

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