Dielectric properties and microstructure of Sr0.8(K,Na)0.2Bi2Nb2O9 ferroelectric ceramics

Journal of Alloys and Compounds

Volumn 477, Issue 1-2, 2009, Pages 828-831

  Fang, Pinyang ^a   Fan, Huiqing ^a   Liu, Laijun ^a   Chen, Jin ^a   Li, Jin ^a  

^a NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

Author keywords

Aurivillius family; Dielectric properties; Ferroelectrics; SBN

Indexed keywords

AURIVILLIUS FAMILY; BI-LAYER STRUCTURES; BISMUTH OXIDES; DIELECTRIC CONSTANTS; FERROELECTRICS; OXYGEN OCTAHEDRON; PROPERTIES AND MICROSTRUCTURES; SBN; SCANNING ELECTRON MICROGRAPHS; SECONDARY PHASE; SOLID-STATE ROUTES; XRD;

BISMUTH; CERAMIC CAPACITORS; FERROELECTRIC CERAMICS; IONS; LATTICE CONSTANTS; MICROSTRUCTURE; NIOBIUM; OXIDE MINERALS; OXYGEN; PEROVSKITE; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

DIELECTRIC PROPERTIES;

EID: 67349165018     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.10.148     Document Type: Article

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