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Volumn 93, Issue 6-7, 2009, Pages 1116-1119

Crystal quality improvement of solid-phase crystallized evaporated silicon films by in-situ densification anneal

Author keywords

a Si films; Densification anneal; e beam evaporation; Poly Si films

Indexed keywords

A-SI FILMS; BENEFICIAL EFFECTS; CRYSTAL QUALITIES; E-BEAM EVAPORATION; EVAPORATED SILICONS; HIGH RATES; IN-SITU; OXYGEN CONTENTS; POLY-SI FILMS; SI FILMS; SI(1 0 0 ); SOLID-PHASE; TUBE FURNACES;

EID: 67349164020     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2009.01.012     Document Type: Article
Times cited : (6)

References (6)
  • 3
    • 0019586371 scopus 로고
    • Observation of gas absorption in evaporated amorphous silicon films using secondary ion mass spectrometry
    • Magee C.W., Bean J.C., Foti G., and Poate J.M. Observation of gas absorption in evaporated amorphous silicon films using secondary ion mass spectrometry. Thin Solid Films 81 (1981) 1-6
    • (1981) Thin Solid Films , vol.81 , pp. 1-6
    • Magee, C.W.1    Bean, J.C.2    Foti, G.3    Poate, J.M.4
  • 4
    • 1842475303 scopus 로고    scopus 로고
    • Fast and non-destructive assessment of epitaxial quality of polycrystalline silicon films on glass by optical measurements
    • Straub A., Widenborg P.I., Sproul A., Huang Y., Harder N.P., and Aberle A.G. Fast and non-destructive assessment of epitaxial quality of polycrystalline silicon films on glass by optical measurements. Journal of Crystal Growth 265 (2004) 168-173
    • (2004) Journal of Crystal Growth , vol.265 , pp. 168-173
    • Straub, A.1    Widenborg, P.I.2    Sproul, A.3    Huang, Y.4    Harder, N.P.5    Aberle, A.G.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.