Modeling and characterization of smart LSMO ferromagnetic thin-film tunable resistance

IEEE Transactions on Electron Devices

Volumn 56, Issue 4, 2009, Pages 665-671

  Al Ahmad, Mahmoud ^a   Plana, Robert ^a   Cheon, Chae Il ^b   Yun, Eui Jung ^b  

^a CNRS   (France)

^b Hoseo University   (South Korea)

Author keywords

(La0.67,Sr0.33)MnO3 (LSMO); Electroresistance (ER); Ferromagnetic; Magnetoresistance (MR); Material parameters; Tunability; Tunable circuit; Tunable inductor; Tunable resistor

Indexed keywords

(LA0.67,SR0.33)MNO3 (LSMO); ELECTRORESISTANCE (ER); FERROMAGNETIC; MATERIAL PARAMETERS; TUNABILITY; TUNABLE CIRCUIT; TUNABLE INDUCTOR; TUNABLE RESISTOR;

FERROMAGNETIC MATERIALS; FERROMAGNETISM; LANTHANUM; MAGNETIC FIELD EFFECTS; MAGNETIC PROPERTIES; MAGNETOELECTRONICS; MAGNETORESISTANCE; MANGANESE COMPOUNDS; MATERIALS PROPERTIES; MICROWAVE DEVICES; MICROWAVES; RESISTORS; THIN FILM DEVICES; THIN FILMS;

ELECTRIC RESISTANCE;

EID: 67349154098     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2009.2014191     Document Type: Article

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